Scanning Electron Microscopy and X-Ray Microanalysis

Joseph Goldstein, David C. Joy, Dale E. Newbury, J

Bog | Engelsk

Beskrivelse

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, ele…